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Comparison of light and electron microscoy

 

Light microscopy

Scanning electron microscopy (SEM)

Transmission electron microscopy (TEM)

Resolution

 

 

 
average
500 nm
20 Å (= 2 nm)
100 Å (= 10 nm)
under special conditions
100 nm
2 Å (= 0.2 nm)
5 Å (= 0.5 nm)

depth of field
poor
high
moderate

technique of preparation
usually simple
easy
skilled, liable to artefacts

types of objects
real objects, living or non-living; imprints
non-living, contrasted by coating
non-living, contrast-enhanced; imprints

thickness of preparations
rather thick
variable
very thin

surrounding of the preparation
variable
(usually) vacuum
vacuum

Field of view
large enough
large
limited
J. W. S. HEARLE, J. T. SPARROW, P. M. CROSS, 1972
 


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© Peter v. Sengbusch - b-online@botanik.uni-hamburg.de